Skip to content

Power-constrained testing of VLSI circuits

by Nicola Nicolici

Cover of Power-constrained testing of VLSI circuits

No description available.

Very large scale integration Integrated circuitsSemiconductorsProtectionTestingThermal propertiesSystems engineeringEngineeringComputer-aided designIntegrated circuits, very large scale integrationIntegrated circuitsVery large scale integration