X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography

Name: X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography
Author: Richard B. Hoover

by Richard B. Hoover

Cover of X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography

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CongressesX-ray lithographyInstrumentsCoatingsPolarimetryX-ray opticsExtreme ultraviolet lithographyX-ray astronomyX-ray microscopesOptical imagesUltraviolet astronomyOptical instruments