Two- and three-dimensional vision systems for inspection, control, and metrology

Name: Two- and three-dimensional vision systems for inspection, control, and metrology
Author: Bruce G. Batchelor

by Bruce G. Batchelor

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Optical pattern recognition systemsMetrologyImaging systemsOptical methodsComputer visionQuality controlCongressesOptical measurementsThree-dimensional display systemsImage processingOptical detectorsOptical pattern recognition