High resolution electron microscopy of defects in materials

Name: High resolution electron microscopy of defects in materials
Author: Robert Sinclair, David J. Smith (undifferentiated)

by Robert Sinclair, David J. Smith (undifferentiated)

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MaterialsCongressesDefectsMicroscopyHigh resolution electron microscopyNon-Destructive Testing Of MaterialsScience/MathematicsHigh resolution electron microMaterials, microscopyElectron microscopesElectron microscopy