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Scanning probe microscopies

by A. De Stefanis, A. A. G. Tomlinson

Cover of Scanning probe microscopies

Materials science, especially electronics, continues its miniaturization trend from the scale of microns to nanometers-- thanks to scanning tunneling microscopy (STM) technology, which integrates measurement and fabrication in a single step. The authors, for whom no affiliation is listed, overview the history, physical basis, applications, and impact on next-generation electronics of STM and related microscopies. This concise volume includes instrument photos and images. Lacks an index. c. Book News Inc.

Scanning probe microscopySCANNING TUNNELING MICROSCOPYELECTROCHEMISTRYSURFACESPHYSICS