X-ray spectroscopy

characterization technique

emission of characteristic "secondary" X-rays from a material that has been excited by high-energy X-rays or gamma rays

analytical technique used for the elemental analysis or chemical characterization of a sample

spacecraft instrument

method used to count the number of X-rays of a specific wavelength diffracted by a crystal

technique in crystallography

spectroscopic technique

Emission of secondary X-rays from a material excited by high-energy X-rays