Also known as electrostatic force microscopy, EFM
dynamic non-contact atomic force microscope
ン 静电力显微镜（英語：Electrostatic Force Microscopy，简称EFM）是一种利用测量探针与样品的静电相互作用，来表征样品表面静电势能，电荷分布以及电荷输运的[扫描探针显微镜]。
Abstract from DBpedia / Wikipedia · CC BY-SA
Discovered by embedding cosine similarity (sentence-transformers MiniLM, 384-dim).