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High-temperature operating life · Vinony

EntityQ17029762· pop 5· linked from 6 articles

High-temperature operating life

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reliability test applied to integrated circuits

Connections

Wayback Machine

random-access memory

digital object identifier

integrated circuit

Boltzmann constant

activation energy

thermodynamic temperature

system on a chip

mathematical extrapolation

Arrhenius equation

voltage regulator

engineering tolerance

reliability engineering

Joint Test Action Group

linear feedback shift register

Categories

Environmental testing Semiconductor analysis Semiconductors

Sources

wikipedia.externallinksexternallink

What links here6 pages

electromigration

integrated circuit

Black's equation

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