single-event upset
Sign in to saveAlso known as single event upset, SEU, single-event error, SEE, SEUs, SEEs
change of state caused by one single ionizing particle (ion, electron, photon...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor
Wikidata facts
- Subclass of
- error
- Part of
- soft error
Show 2 more facts
- broader concept
- soft error
- handled, mitigated, or managed by
- ECC memory
Sources (3)
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