X衍射仪
Also known as X-ray diffractometer
A diffractometer is a measuring instrument for analyzing the structure of a material from the scattering pattern produced when a beam of radiation or particles (such as X-rays or neutrons) interacts with it.
Article · 中文
X光繞射儀（X-ray diffractometer，XRD）是利用X光繞射原理研究物质内部结构的一种大型分析仪器。令一束X光和样品交互，用生成的衍射图谱来分析物质结构。它是在X射線晶体学领域中在原子尺度范围内研究材料结构的主要仪器，也可用于研究非晶体。
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