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Sign in to savealt=NANOVEA PS50 Non-Contact Optical Profilometer|thumb|322x322px|Non-Contact Optical Profilometer thumb|250px|A contact profilometer at Laboratory for analysis and architecture of systems|LAAS technological facility in Toulouse, France.
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optical fiber
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Q180686
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cryogenics
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scanning tunneling microscope
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interferometry
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micro-electromechanical systems
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Q22908627
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moiré pattern
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surface roughness
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confocal microscopy
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atomic force microscopy
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surface finish
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