EntityQ225990· pop 5· linked from 10 articlesScan chainSign in to savetype of manufacturing test used with integrated circuitsConnectionsAutomatic test pattern generationEntityInternational Standard Book NumberEntityintegrated circuitEntityflip-flopEntitysystem on a chipEntityapplication-specific integrated circuitEntitySerial Peripheral InterfaceEntitysequential logicEntityshift registerEntityclock signalEntitycombinational logicEntityelectronic design automationEntitycontrollabilityEntityobservabilityEntityintegrated circuit designEntityDesign for testingEntityCategoriesElectronic circuit verification