EntityQ2538844· pop 6· linked from 26 articleswafer testingSign in to savestep performed during semiconductor device fabrication by applying special test patterns to a wafer before it is sent to die preparationConnectionsintegrated circuit packagingEntitysemiconductor device fabricationEntityInternational Standard Book NumberEntityintegrated circuitEntityAutomatic test pattern generationEntityTeradyneEntityChip scale packageEntityback end of lineEntityContact padEntityCategoriesSemiconductor device fabrication