エリプソメトリー
Sign in to savethumb|An Ellipsometer at Laboratory for Analysis and Architecture of Systems|LAAS-CNRS in Toulouse, France Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model.
Wikidata facts
- Instance of
- measurement
Show 3 more facts
- Commons gallery
- Ellipsometry
- maintained by WikiProject
- WikiProject Mathematics
- Commons category
- Ellipsometry
Sources (2)
via Wikidata · CC0
Article · 日本語
偏光解析法またはエリプソメトリー(ellipsometry)とは偏光を利用した分析手法。
Abstract from DBpedia / Wikipedia · CC BY-SA