EntityQ258563· pop 16· linked from 154 articlesfocused ion beamSign in to savedeviceConnectionselectron microscopeEntitysputteringEntitycryogenic electron microscopyEntitynanowireEntityelectron microprobeEntityEnvironmental scanning electron microscopeEntitytransmission electron microscopyEntityheliumEntityelectronEntityInternational Standard Book NumberEntityplatinumEntitygalliumEntityRichard FeynmanEntitytungstenEntitymicroscopeEntityionEntitysemiconductorEntityjouleEntitydigital object identifierEntityelectric fieldEntityCategoriesElectron microscopyScientific techniquesSemiconductor device fabricationThin film deposition